Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2021), An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs, Randall S. Bilof (Eds.), In Proceedings - 2021 IEEE International Test Conference, ITC 2021 p.329-333, IEEE.

Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Applying Thermal Side-Channel Attacks on Asymmetric Cryptography, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1930 - 1942.

Johan Peltenburg, Lars T.J. Van Leeuwen, Joost Hoozemans, Jian Fang, Zaid Al-Ars, H.Peter Hofstee (2021), Battling the CPU Bottleneck in Apache Parquet to Arrow Conversion Using FPGA, In 2020 International Conference on Field-Programmable Technology (ICFPT) p.281-286, IEEE.

L. Wu, Siddharth Rao, M. Taouil, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2021), Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM, In Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021 p.1717-1722, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2021), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs, In 2020 IEEE International Test Conference, ITC 2020 p.1-10, IEEE.

J. Yu (2021), Computation-in-Memory: From Circuits to Compilers, PhD Thesis Delft University of Technology.

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE.

Carlo Sau, Claudia Rinaldi, Luigi Pomante, Francesca Palumbo, Giacomo Valente, Tiziana Fanni, Marcos Martinez, Frank van der Linden, Zaid Al-Ars, More Authors (2021), Design and management of image processing pipelines within CPS: Acquired experience towards the end of the FitOptiVis ECSEL Project, In Microprocessors and Microsystems Volume 87 p.1-23.

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.

T.C. Köylü, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2021), Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks, In 2021 18th International Conference on Privacy, Security and Trust (PST) p.1-10, IEEE.