Seongyeon Park, Hajin Kim, Tanveer Ahmad, Nauman Ahmed, Zaid Al-Ars, Peter Hofstee, Youngsok Kim, Jinho Lee (2022), SALoBa: Maximizing Data Locality and Workload Balance for Fast Sequence Alignment on GPUs, L. O'Conner (Eds.), In Proceedings of the 2022 IEEE International Parallel and Distributed Processing Symposium (IPDPS) p.728-738, IEEE.

Troya Çağıl Köylü, Said Hamdioui, Mottaqiallah Taouil (2022), Smart Redundancy Schemes for ANNs against Fault Attacks, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui (2022), Special Session: STT-MRAMs: Technology, Design and Test, In Proceedings - of the 2022 IEEE 40th VLSI Test Symposium, VTS 2022, IEEE.

Abdulqader Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Said Hamdioui, Sorin Cotofana (2022), Spin Wave Based Approximate Computing, In IEEE Transactions on Emerging Topics in Computing Volume 10 p.1932-1940.

A.N.N. Mahmoud (2022), Spin Wave Circuit Design, PhD Thesis Delft University of Technology.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2022), Structured Test Development Approach for Computation-in-Memory Architectures, C. Ceballos (Eds.), In Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia) p.61-66, IEEE.

Mahdi Zahedi, Taha Shahroodi, Geert Custers, Abhairaj Singh, Stephan Wong, Said Hamdioui (2022), System Design for Computation-in-Memory: From Primitive to Complex Functions, In Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) p.1-6, IEEE.

M. Fieback (2022), Testing RRAM and Computation-in-Memory Devices: Defects, Fault Models, and Test Solutions, PhD Thesis Delft University of Technology.

T.C. Köylü, M. Fieback, S. Hamdioui, M. Taouil (2022), Using Hopfield Networks to Correct Instruction Faults, In 2022 IEEE 31st Asian Test Symposium (ATS) p.102-107, IEEE.

Josie E.Rodriguez Condia, Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Juan-David Guerrero-Balaguera, Said Hamdioui, Christian Sauer, Matteo Sonza Reorda (2022), Using STLs for Effective In-field Test of GPUs, In IEEE Design & Test Volume 40 p.109-117.