Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar (2019), Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Peng Sun, Piet Van Mieghem, R.E. Kooij, Zhidong He, Piet Van Mieghem (2019), Quantifying the Robustness of Network Controllability, In 2019 4th International Conference on System Reliability and Safety, ICSRS 2019 p.66-76.

A. Bosio, I. O'Connor, G.S. Rodrigues, F.K. Lima, E.I. Vatajelu, G. di Natale, L. Anghel, Surya Nagarajan, M.C.R. Fieback, S. Hamdioui (2019), Rebooting Computing: The Challenges for Test and Reliability, In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.1-6, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability Volume 99 p.52-61.

Daniël Kraak, C. C. Gursoy, I. O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, In 2019 IEEE Latin American Test Symposium (LATS) p.1-6, IEEE.

Hamid Mushtaq, Nauman Ahmed, Zaid Al-Ars (2019), SparkGA2: Production-quality memory-efficient Apache Spark based genome analysis framework, In PLoS ONE Volume 14 p.1-14.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui (2019), System-level sub-20 nm planar and FinFET CMOS delay modelling for supply and threshold voltage scaling under process variation, In Journal of Low Power Electronics Volume 15 p.1-10.

Said Hamdioui, M. Fieback, S. Nagarajan, Mottaqiallah Taouil (2019), Testing Computation-in-Memory Architectures Based on Emerging Memories, In 2019 IEEE International Test Conference (ITC), IEEE.

Josie E.Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda (2019), Untestable faults identification in GPGPUs for safety-critical applications, In 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 p.570-573, Institute of Electrical and Electronics Engineers (IEEE).

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels (2018), A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 37 p.311-323.