Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi Tahoori, Mottaqiallah Taouil, Said Hamdioui (2020), Testing Scouting Logic-Based Computation-in-Memory Architectures, In Proceedings - 2020 IEEE European Test Symposium, ETS 2020 p.1-6, IEEE.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2020), The Power of Computation-in-Memory Based on Memristive Devices, In 25th Asia and South Pacific Design Automation Conference (ASP-DAC) p.385-392, IEEE.

Vishal Gupta, Saurabh Khandelwal, Giulio Panunzi, Eugenio Martinelli, Said Hamdioui, Abusaleh Jabir, Marco Ottavi (2020), Yield Estimation of a Memristive Sensor Array, In 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) p.1-2, IEEE.

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), A Computation-In-Memory Accelerator Based on Resistive Devices, In Proceedings of the International Symposium on Memory Systems p.19-32, Association for Computing Machinery (ACM).

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando G. Redondo, G. Karunaratne, Abbas Rahimi, Luca Benini (2019), Applications of Computation-In-Memory Architectures based on Memristive Devices, In Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 p.486-491, IEEE.

G. S. Rodrigues, J. S. Fonseca, F. L. Kastensmidt, V. Pouget, A. Bosio, S. Hamdioui (2019), Approximate TMR based on successive approximation and loop perforation in microprocessors, In Microelectronics Reliability Volume 100-101.

Ali Banagozar, Kanishkan Vadivel, Sander Stuijk, Henk Corporaal, Stephan Wong, Muath Abu Lebdeh, Jintao Yu, Said Hamdioui (2019), CIM-SIM: Computation in Memory SIMuIator, Sander Stuijk (Eds.), In SCOPES'19 p.1-4, Association for Computing Machinery (ACM).

Hassen Aziza, Christian Dufaza, Annie Perez, Said Hamdioui (2019), Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs, In Journal of Circuits, Systems and Computers Volume 28 p.1-14.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.