Hassen Aziza, Christian Dufaza, Annie Perez, Said Hamdioui (2019), Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs, In Journal of Circuits, Systems and Computers Volume 28 p.1-14.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.

M. Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, S Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui (2019), Device-Aware Test: A New Test Approach Towards DPPB Level, In 2019 IEEE International Test Conference, ITC 2019, IEEE.

Felipe Augusto Da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2019), Efficient Methodology for ISO26262 Functional Safety Verification, Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos (Eds.), In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 p.255-256, IEEE.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Hardware-based aging mitigation scheme for memory address decoder, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Anne Siemon, Dirk Wouters, Said Hamdioui, Stephan Menzel (2019), Memristive device modeling and circuit design exploration for computation-in-memory, In 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings Volume 2019-May, Institute of Electrical and Electronics Engineers (IEEE).

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.162-167, IEEE.

Alina Lumini Ia Machidon, Catalin Bogdan Ciobanu, Octavian Mihai Machidon, Petre Lucian Ogrutan (2019), On Parallelizing Geometrical PCA Approximation, Adrian Istrate, Paul Gasner (Eds.), In Proceedings - 2019 18th RoEduNet Conference Volume 2019-October, IEEE.

Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 27 p.1308-1321.