Vishal Gupta, Saurabh Khandelwal, Giulio Panunzi, Eugenio Martinelli, Said Hamdioui, Abusaleh Jabir, Marco Ottavi (2020), Yield Estimation of a Memristive Sensor Array, In 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) p.1-2, IEEE .

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), A Computation-In-Memory Accelerator Based on Resistive Devices, In Proceedings of the International Symposium on Memory Systems p.19-32, Association for Computing Machinery (ACM).

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando G. Redondo, G. Karunaratne, Abbas Rahimi, Luca Benini (2019), Applications of Computation-In-Memory Architectures based on Memristive Devices, In Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 p.486-491, IEEE .

G. S. Rodrigues, J. S. Fonseca, F. L. Kastensmidt, V. Pouget, A. Bosio, S. Hamdioui (2019), Approximate TMR based on successive approximation and loop perforation in microprocessors, In Microelectronics Reliability Volume 100-101.

Ali Banagozar, Kanishkan Vadivel, Sander Stuijk, Henk Corporaal, Stephan Wong, Muath Abu Lebdeh, Jintao Yu, Said Hamdioui (2019), CIM-SIM: Computation in Memory SIMuIator, Sander Stuijk (Eds.), In SCOPES'19 p.1-4, Association for Computing Machinery (ACM).

Hassen Aziza, Christian Dufaza, Annie Perez, Said Hamdioui (2019), Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs, In Journal of Circuits, Systems and Computers Volume 28 p.1-14.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE .

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.

M. Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, S Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui (2019), Device-Aware Test: A New Test Approach Towards DPPB Level, In 2019 IEEE International Test Conference, ITC 2019, IEEE .

Felipe Augusto Da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2019), Efficient Methodology for ISO26262 Functional Safety Verification, Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos (Eds.), In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 p.255-256, IEEE .