S. Hamdioui, M. Taouil (2021), Device Aware Test for Memory Units.

Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels (2021), Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*, In 2021 IEEE European Test Symposium (ETS), IEEE.

E. Brum, M. Fieback, T.S. Copetti, H. Jiayi, S. Hamdioui, F. Vargas, L.M. Bolzani Poehls (2021), Evaluating the Impact of Process Variation on RRAMs, In 2021 IEEE 22nd Latin American Test Symposium, LATS 2021 p.1-6, IEEE.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen (2021), Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 37 p.383-394.

Luca Mariot, Stjepan Picek, Domagoj Jakobovic, Alberto Leporati (2021), Evolutionary algorithms for designing reversible cellular automata, In GENETIC PROGRAMMING AND EVOLVABLE MACHINES Volume 22 p.429-461.

Abdulqader Mahmoud, Christoph Adelmann, Frederic Vanderveken, Sorin Cotofana, Florin Ciubotaru, Said Hamdioui (2021), Fan-out of 2 Triangle Shape Spin Wave Logic Gates, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.948-953, IEEE.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2021), Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs, In 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) p.1-7, IEEE.

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepulveda (2021), GRINCH: A Cache Attack against GIFT Lightweight Cipher, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.549-554, IEEE.

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2021), Intermittent Undefined State Fault in RRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.

Daan Valk, Stjepan Picek, Shivam Bhasin (2021), Kilroy Was Here: The First Step Towards Explainability of Neural Networks in Profiled Side-Channel Analysis, Guido Marco Bertoni, Francesco Regazzoni (Eds.), In Constructive Side-Channel Analysis and Secure Design - 11th International Workshop, COSADE 2020, Revised Selected Papers Volume 12244 p.175-199, Springer.