Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi Tahoori (2022), PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Stjepan Picek, Annelie Heuser, Guilherme Perin, Sylvain Guilley (2022), Profiled Side-Channel Analysis in the Efficient Attacker Framework, Vincent Grosso, Thomas Pöppelmann (Eds.), In Smart Card Research and Advanced Applications Volume 13173 p.44-63, Springer.

Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui (2022), RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs), In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama (2022), Rapid Design-Space Exploration for Low-Power Manycores under Process Variation utilizing Machine Learning, In IEEE Access Volume 10 p.70187-70203.

Abhairaj Singh, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui (2022), Referencing-in-Array Scheme for RRAM-based CIM Architecture, Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu (Eds.), In Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 p.1413-1418, IEEE.

Jorai Rijsdijk, Lichao Wu, Guilherme Perin (2022), Reinforcement Learning-Based Design of Side-Channel Countermeasures, Lejla Batina, Stjepan Picek, Stjepan Picek, Mainack Mondal (Eds.), In Security, Privacy, and Applied Cryptography Engineering p.168-187, Springer.

Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil (2022), Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes, In Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1189-1192, IEEE.

Troya Çağıl Köylü, Said Hamdioui, Mottaqiallah Taouil (2022), Smart Redundancy Schemes for ANNs against Fault Attacks, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui (2022), Special Session: STT-MRAMs: Technology, Design and Test, In Proceedings - of the 2022 IEEE 40th VLSI Test Symposium, VTS 2022, IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2022), Structured Test Development Approach for Computation-in-Memory Architectures, C. Ceballos (Eds.), In Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia) p.61-66, IEEE.