R Ishihara, PC van der Wilt, BD van Dijk, JW Metselaar, CIM Beenakker (2003), Property of single-crystalline Si TFTs fabricated with µ-Czochralski (Grain Filter) process, AT Voutsas (Eds.), In Poly-silicon thin film transistor technology and applications in displays and other novel technology areas p.10-19, SPIE.

VP Iordanov, R Ishihara, PM Sarro, J Bastemeijer, A Bossche, MJ Vellekoop (2002), 9.6: CMOS compatible optical filter for high-throughput enzymatic analysis devices, In Proceedings of IEEE sensors 2002: first IEEE international conference on sensors. Vol. I p.225-228, IEEE Society.

R Ishihara (2002), Crystallization characteristics of the Micro-Czochralski processed Si grains, Delft University of Technology Volume Progress Report II.

F Yan, P Migliorato, N Bavidge, R Ishihara (2002), Dynamic characteristics of single grain silicon TFTs, Y Kuo (Eds.), In Thin film transistor technologies VI; proceedings of the electrochemical society's 202nd meeting p.75-79, ECS.

A Burtsev, R Ishihara, CIM Beenakker (2002), Energy density window for location controlled Si grains by dual-beam excimer laser, In Thin Solid Films Volume 419 p.199-206.

VP Iordanov, J Bastemeijer, R Ishihara, PM Sarro, A Bossche, MJ Vellekoop (2002), Filtered photodiode arrays for NADH fluorescence analysis, In Proceedings of SeSens 2002 p.627-630, STW Stichting voor de Technische Wetenschappen.

R Ishihara, PC van der Wilt, BD van Dijk, JW Metselaar, CIM Beenakker (2002), Location-control of large grains by ¿-czochralski (grain filter) process and its application to single-crystalline silicon thin-film transistors, Y Kuo (Eds.), In Thin film transistor technologies VI; proceedings of the electrochemical society's 202nd meeting p.63-74, ECS.

R Ishihara (2002), Mask layout, Delft University of Technology Volume Progress Report.

R Ishihara (2002), Measurement results of 2nd c-Si TFT run, Delft University of Technology Volume Progress Report.

R Ishihara (2002), Measurement results of SLS crystallized poly-Si TFTs, Delft University of Technology.