Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar (2019), Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

A. Bosio, I. O'Connor, G.S. Rodrigues, F.K. Lima, E.I. Vatajelu, G. di Natale, L. Anghel, Surya Nagarajan, M.C.R. Fieback, S. Hamdioui (2019), Rebooting Computing: The Challenges for Test and Reliability, In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.1-6, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability Volume 99 p.52-61.

Daniël Kraak, C. C. Gursoy, I. O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, In 2019 IEEE Latin American Test Symposium (LATS) p.1-6, IEEE.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui (2019), System-level sub-20 nm planar and FinFET CMOS delay modelling for supply and threshold voltage scaling under process variation, In Journal of Low Power Electronics Volume 15 p.1-10.

Said Hamdioui, M. Fieback, S. Nagarajan, Mottaqiallah Taouil (2019), Testing Computation-in-Memory Architectures Based on Emerging Memories, In 2019 IEEE International Test Conference (ITC), IEEE.

Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), Time-division Multiplexing Automata Processor, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.794-799, IEEE.

Josie E.Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda (2019), Untestable faults identification in GPGPUs for safety-critical applications, In 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 p.570-573, Institute of Electrical and Electronics Engineers (IEEE).

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels (2018), A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 37 p.311-323.

G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui (2018), A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs, In Microelectronics Reliability Volume 88-90 p.355-359.