Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.

M. Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, S Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui (2019), Device-Aware Test: A New Test Approach Towards DPPB Level, In 2019 IEEE International Test Conference, ITC 2019, IEEE.

Felipe Augusto Da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2019), Efficient Methodology for ISO26262 Functional Safety Verification, Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos (Eds.), In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 p.255-256, IEEE.

Sohaib Majzoub, Resve A. Saleh, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui (2019), Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era, In IEEE Access Volume 7 p.33115-33129.

Honorio Martin, Pedro Peris-Lopez, Giorgio Di Natale, Mottaqiallah Taouil, Said Hamdioui (2019), Enhancing PUF based challenge-response sets by exploiting various background noise configurations, In Electronics (Switzerland) Volume 8 p.1-14.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Hardware-based aging mitigation scheme for memory address decoder, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Muath Abu Lebdeh, Uljana Reinsalu, Hoang Anh Du Nguyen, Stephan Wong, Said Hamdioui (2019), Memristive Device Based Circuits for Computation-in-Memory Architectures, In 2019 IEEE International Symposium on Circuits and Systems (ISCAS) p.1-5, IEEE.

Anne Siemon, Dirk Wouters, Said Hamdioui, Stephan Menzel (2019), Memristive device modeling and circuit design exploration for computation-in-memory, In 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings Volume 2019-May, Institute of Electrical and Electronics Engineers (IEEE).

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.162-167, IEEE.

Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 27 p.1308-1321.