I Sourdis, R Smet de, G Stefanakis, GN Gaydadjiev (2010), Data structure, method and system for address lookup.

D Ludovici, A Strano, GN Gaydadjiev, L Benini, D Bertozzi (2010), Design space exploration of a mesochronous link for cost-effective and flexible GALS NOCs, s.n. (Eds.), In Design, automation & test in Europe p.679-684, s.n..

M Fazlali, A Zakerolhosseini, GN Gaydadjiev (2010), Efficient datapath merging for the overhead reduction of run-time reconfigurable systems, In Journal of Supercomputing: an international journal of high-performance computer design, analysis and use Volume 52.

Y Lu, GN Gaydadjiev, KLM Bertels (2010), Efficient hardware task reuse and interrupt handling for FPGA-based partially reconfigurable systems, s.n. (Eds.), In Proc. 2010 Intl. conf. on field-programmable technology p.324-327, IEEE.

S Tzilis, I Sourdis, GN Gaydadjiev (2010), Fine-grain fault diagnosis for FPGA logic blocks, s.n. (Eds.), In Proc. 2010 Intl. conf. on field-programmable technology p.154-161, IEEE.

AAC Brandon, I Sourdis, GN Gaydadjiev (2010), General purpose computing with reconfigurable acceleration, s.n. (Eds.), In 2010 intl. conf on field programmable logic and applications p.588-591, IEEE.

C Strydis, D Dave, GN Gaydadjiev (2010), ImpBench revisited: an extended characterization of implant-processor benchmarks, s.n. (Eds.), In 2010 Intl. conf. on embedded computer systems: architectures, modeling and simulation p.126-135, IEEE.

D Dave, C Strydis, GN Gaydadjiev (2010), ImpEDE: a multidimesional design-space exploration framework for biomedical-implant processors, s.n. (Eds.), In 21st IEEE conf. on application-specific systems, architectures and processors p.39-46, IEEE.

AJ van de Goor, C Jung, S Hamdioui, GN Gaydadjiev (2010), Low-cost, customized and flexible SRAM MBIST engine, s.n. (Eds.), In IEEE Intl. symposium on design and diagnostics of electronic circuits and systems p.382-387, IEEE.

AJ van de Goor, GN Gaydadjiev, S Hamdioui (2010), Memory testing with a RISC microcontroller, s.n. (Eds.), In Design, automation & test in Europe 2010 p.214-219, IEEE.