M Rieback, GN Gaydadjiev, B Crispo, R.F.H. Hofman, AS Tanenbaum (2006), A platform for RFID security and privacy administration, s.n. (Eds.), In Proc. 20th Large Installation System Administration Conf. p.89-102, USENIX.

S Hamdioui, Z Al-Ars, GN Gaydadjiev, J delos Reyes (2006), Comparison of static and dynamic faults in 65nm memory technology, s.n. (Eds.), In International Design and Test workshop p.-, IEEE Society.

Z Al-Ars, S Hamdioui, AJ van de Goor, GN Gaydadjiev, J Vollrath (2006), DRAM-specific space of memory tests, s.n. (Eds.), In International Test Conference 2006 p.1-10, IEEE Society.

B Donchev, GN Gaydadjiev, GK Kuzmanov (2006), External memory controller for virtex II pro, s.n. (Eds.), In 2006 International Symposium on System-on-Chip p.37-40, IEEE Society.

B de Ruijsscher, GN Gaydadjiev, JF Lichtenauer, EA Hendriks (2006), FPGA accelerator for real-time skin segmentation, S. Ha, S Chakraborty (Eds.), In Proceedings of the 2006 IEEE/ACM/IFIP Workshop on Embedded Systems for Real Time Multimedia p.93-97, IEEE Society.

GK Kuzmanov, GN Gaydadjiev, S Vassiliadis (2006), Multimedia rectangularly addressable memory, In IEEE Transactions on Multimedia Volume 8 p.315-322.

S Vassiliadis, GK Kuzmanov, S Wong, E Panainte, GN Gaydadjiev, K Bertels, D Cheresiz (2006), PISC: Polymorphic instruction set computers, K Bertels, J Cardoso, S Vassiliadis (Eds.), In Reconfigurable Computing: Architectures and Applications p.274-286, Springer.

GN Gaydadjiev, S Vassiliadis (2006), SAD prefetching for MPEG4 using flux caches, S Vassiliadis, S Wong, TD Hamalainen (Eds.), In Embedded Computer Systems: Architectures, Modeling, and Simulation p.248-258, Springer.

S Hamdioui, Z Al-Ars, LL Mhamdi, GN Gaydadjiev, S Vassiliadis (2006), Trends in tests and failure mechanisms in deep sub-micron technologies, P Girard, M Masmoudi, J Mouine, M Renovell (Eds.), In 2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology p.216-221, IEEE Society.

Z Al-Ars, S Hamdioui, GN Gaydadjiev (2006), Using linear tests for transient faults in DRAMs, s.n. (Eds.), In International Design and Test workshop p.-, IEEE Society.