N Aymerich, SD Cotofana, A Rubio (2012), Adaptive fault-tolerant architecture for unreliable technologies with heterogenous variability, In IEEE Transactions on Nanotechnology Volume 11 p.1-12.

N Cucu Laurenciu, SD Cotofana (2012), Context aware slope based transistor-level aging model, In Microelectronics Reliability Volume 52 p.1-6.

AM Molnos, A Beyranvand Nejad, BT Nguyen, SD Cotofana, KGW Goossens (2012), Decoupled inter- and intra-application scheduling for composable and robust embedded MPSoC platforms, s.n. (Eds.), In 15th Intl.Workshop on software and compilers for embedded systems p.1-9, ACM.

N Aymerich, SD Cotofana, A Rubio (2012), Degradation stochastic resonance (DSR) in AD-AVG architectures, s.n. (Eds.), In 12th IEEE International conference on nanotechnology p.1-4, IEEE.

AT Nelson, AM Molnos, A Beyranvand Nejad, D Mirzoyan, SD Cotofana, KGW Goossens (2012), Embedded computer architecture laboratory: a hands-on experience programming embedded systems with resource and energy constraints, s.n. (Eds.), In Workshop on embedded and cyber-physical systems education p.1-8, ACM.

S Safiruddin, DV Borodin, M Lefter, GR Voicu, SD Cotofana (2012), Is 3D integration the way to future dependable computing platforms?, s.n. (Eds.), In 3th International conference on optimization of electrical and electronic equipment p.1-10, IEEE.

M Enachescu, GR Voicu, SD Cotofana (2012), Is the road towards "zero-energy" paved with NEMFET-based power management?, In IEEE International symposium on circuits and systems p.1-4, IEEE.

Y Wang, SD Cotofana, L Fang (2012), Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices, s.n. (Eds.), In ACM International symposium on nanoscale architectures p.1-7, IEEE.

S Safiruddin, F Peper, SD Cotofana (2012), Stigmergic search with single electron tunneling technology based memory enhanced hubs, s.n. (Eds.), In IEEE/ACM International Symposium on Nanoscale Architectures p.1-7, IEEE.

Y Wang, M Enachescu, SD Cotofana, L Fang (2012), Variation tolerant on-chip degradation sensors for dynamic reliability management systems, In Microelectronics Reliability Volume 52 p.1-6.