J Tan, A Baiano, R Ishihara, CIM Beenakker (2008), 2D simulation of hot-carrier-induced degradation and reliability analysis for single grain Si TFTs, s.n. (Eds.), In The annual workshop on semiconductor advances for future electronics and sensors p.600-603, STW.

WM Chim, N Saputra, A Baiano, JR Long, R Ishihara, AJ van Genderen (2008), A flexible active-matrix electronic paper with integrated display driver using the u-Czochralski single grain TFT technology, s.n. (Eds.), In 19th annual workshop on circuits, systems and signal processing p.161-165, STW.

J Derakhshandeh Kheljani, MR Tajari Mofrad, R Ishihara, J van der Cingel, CIM Beenakker (2008), A study on CMP effect on the quality of thin silicon film characterized by micro czochraslki process with excimer-laser irradiation, J Jang (Eds.), In The proceeding of the 4th international TFT conference p.327-330, s.n..

N Saputra, MM Danesh, A Baiano, R Ishihara, JR Long, N Karaki, S Inoue (2008), An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration, In IEEE Journal of Solid State Circuits Volume 43 p.1563-1576.

N Matsuki, R Ishihara, A Baiano, Y Hiroshima, S Inoue, CIM Beenakker (2008), Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy, s.n (Eds.), In Materials Research Society Symposium Proceedings p.94-99, MRS.

MR Tajari Mofrad, J Derakhshandeh Kheljani, R Ishihara, CIM Beenakker (2008), Fabrication of three-dimensional inverters using the ¿-czochralski, S Hall, A Walton (Eds.), In ESSDERC Fringe 2008 p.22-25, s.n..

A Baiano, R Ishihara, J van der Cingel, CIM Beenakker (2008), Formation of location-controlled germanium grains by excimer laser, Y Kuo (Eds.), In Thin film transistors 9 (TFT 9) p.153-157, s.n..

A Baiano, R Ishihara, J van der Cingel, CIM Beenakker (2008), Germanium grains location control using ¿-czochralski process, s.n. (Eds.), In The annual workshop on semiconductor advances for future electronics and sensors p.449-452, STW.

T Chen, R Ishihara, CIM Beenakker (2008), High quality SiO2 deposited under 100oC by inductively coupled plasma (ICP) enhanced CVD, H Hamada (Eds.), In Digest of technical papers of the fifteenth international workshop on active-matrix flatpanel displays and devices -TFT technologies and FPD materials p.49-52, Japan Society of Applied Physics.

N Matsuki, R Ishihara, A Baiano, CIM Beenakker (2008), Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy, In Applied Physics Letters Volume 93.