P.A. 't Hart, M. Babaie, A. Vladimirescu, F. Sebastiano (2021), Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures, In IEEE Journal of the Electron Devices Society Volume 9 p.891-901.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2021), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs, In 2020 IEEE International Test Conference, ITC 2020 p.1-10, IEEE.

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE.

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.

T.C. Köylü, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2021), Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks, In 2021 18th International Conference on Privacy, Security and Trust (PST) p.1-10, IEEE.

S. Hamdioui, M. Taouil (2021), Device Aware Test for Memory Units.

Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels (2021), Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*, In 2021 IEEE European Test Symposium (ETS), IEEE.

E. Brum, M. Fieback, T.S. Copetti, H. Jiayi, S. Hamdioui, F. Vargas, L.M. Bolzani Poehls (2021), Evaluating the Impact of Process Variation on RRAMs, In 2021 IEEE 22nd Latin American Test Symposium, LATS 2021 p.1-6, IEEE.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen (2021), Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 37 p.383-394.

Abdulqader Mahmoud, Christoph Adelmann, Frederic Vanderveken, Sorin Cotofana, Florin Ciubotaru, Said Hamdioui (2021), Fan-out of 2 Triangle Shape Spin Wave Logic Gates, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.948-953, IEEE.