Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Multi-bit blinding: A countermeasure for RSA against side channel attacks, In 2021 IEEE 39th VLSI Test Symposium (VTS), IEEE.

Abdulqader Nael Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana (2021), Multi-frequency Data Parallel Spin Wave Logic Gates, In IEEE Transactions on Magnetics Volume 57.

Hassan Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau, Patrick Girard, Arnaud Virazel, Karine Coulié (2021), Multi-level control of resistive ram (Rram) using a write termination to achieve 4 bits/cell in high resistance state, In Electronics (Switzerland) Volume 10.

Shubham Rai, Mengyun Liu, Anteneh Gebregiorgis, Debjyoti Bhattacharjee, Krishnendu Chakrabarty, Said Hamdioui, Anupam Chattopadhyay, Jens Trommer, Akash Kumar (2021), Perspectives on Emerging Computation-in-Memory Paradigms, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1925-1934, IEEE.

M. Taouil, A.A.M. Aljuffri, S. Hamdioui (2021), Power Side Channel Attacks: Where Are We Standing?, In 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE.

Troya Çağıl Köylü, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Protecting IoT Devices through a Hardware-driven Memory Verification, L. O'Conner (Eds.), In 2021 24th Euromicro Conference on Digital System Design (DSD) p.115-122, IEEE.

Aritra Sarkar, Zaid Al-Ars, Koen Bertels (2021), QuASeR: Quantum Accelerated de novo DNA sequence reconstruction, In PLoS ONE Volume 16.

Luíza Caetano Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepulveda (2021), Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron, L. O'Conner (Eds.), In 2021 24th Euromicro Conference on Digital System Design (DSD) p.514-518, IEEE.

L. M.Bolzani Poehls, M. C.R. Fieback, S. Hoffmann-Eifert, T. Copetti, E. Brum, S. Menzel, S. Hamdioui, T. Gemmeke (2021), Review of Manufacturing Process Defects and Their Effects on Memristive Devices, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 37 p.427-437.

Abhairaj Singh, Muath Abu Lebdeh, Anteneh Gebregiorgis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui (2021), SRIF: Scalable and Reliable Integrate and Fire Circuit ADC for Memristor-Based CIM Architectures, In IEEE Transactions on Circuits and Systems I: Regular Papers Volume 68 p.1917-1930.