Johan de Wit, Wolter Pieters, Pieter van Gelder (2023), Bias and noise in security risk assessments, an empirical study on the information position and confidence of security professionals, In Security Journal Volume 37 p.170-191.

Volker Stocker, William Lehr, Georgios Smaragdakis (2023), COVID-19 and the Internet: Lessons Learned, Jason Whalley, Volker Stocker, William Lehr (Eds.), In Beyond the Pandemic? p.17-69.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Leticia Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui (2023), Characterization and Test of Intermittent Over RESET in RRAMs, In Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS).

Ties van der Heijden, Peter Palensky, Nick van de Giesen, Edo Abraham (2023), Closed-loop simulation testing of a probabilistic DR framework for Day Ahead Market participation applied to Battery Energy Storage Systems, In 2023 IEEE 32nd International Symposium on Industrial Electronics, ISIE 2023 - Proceedings p.1-6.

Vetrivel Subramaniam Rajkumar, Alexandru Stefanov, A. Presekal, P. Palensky, José L. Rueda (2023), Cyber Attacks on Power Grids: Causes and Propagation of Cascading Failures, In IEEE Access Volume 11 p.103154-103176.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS).

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS).

Aditya Shekhar, Gautam Rituraj, Robin van der Sande, Miad Ahmadi, Rohan Deshmukh, Pavol Bauer, Vaibhav Nougain, Aleksandra Lekic, Peter Palensky (2023), Development of Reliable Power Electronic Systems using Real Time Digital Twin Based Power Hardware-in-the-Loop Testbed, In Proceedings of the 2023 IEEE Belgrade PowerTech p.1-6.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Hassen Aziza (2023), Device-Aware Test for Ion Depletion Defects in RRAMs, Cristina Ceballos (Eds.), In Proceedings of the 2023 IEEE International Test Conference (ITC) p.246-255.

Subir Halder, Amrita Ghosal, Mauro Conti (2023), Dynamic Super Round-Based Distributed Task Scheduling for UAV Networks, In IEEE Transactions on Wireless Communications Volume 22 p.1014-1028.