Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.162-167, IEEE.

Stjepan Picek, Domagoj Jakobovic (2019), On the design of S-box constructions with genetic programming, M. López-Ibáñez (Eds.), In GECCO'19 p.395-396, ACM.

Léo Weissbart, Stjepan Picek, Lejla Batina (2019), One trace is all it takes: machine learning-based side-channel attack on EDDSA, Shivam Bhasin, Avi Mendelson, Mridul Nandi (Eds.), In Security, Privacy, and Applied Cryptography Engineering - 9th International Conference, SPACE 2019, Proceedings p.86-105, Springer.

Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 27 p.1308-1321.

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar (2019), Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Stjepan Picek, Dirmanto Jap, Shivam Bhasin (2019), Poster: When adversary becomes the guardian - Towards side-channel security with adversarial attacks, In CCS '19 p.2673-2675, ACM.

Lejla Batina, Shivam Bhasin, Dirmanto Jap, Stjepan Picek (2019), Poster: Recovering the input of neural networks via single shot side-channel attacks, In CCS '19 p.2657-2659, ACM.

A. Bosio, I. O'Connor, G.S. Rodrigues, F.K. Lima, E.I. Vatajelu, G. di Natale, L. Anghel, Surya Nagarajan, M.C.R. Fieback, S. Hamdioui (2019), Rebooting Computing: The Challenges for Test and Reliability, In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.1-6, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability Volume 99 p.52-61.

Daniël Kraak, C. C. Gursoy, I. O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, In 2019 IEEE Latin American Test Symposium (LATS) p.1-6, IEEE.