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F. Smailbegovic, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2024), Integrated circuit device for iot applications.

S. Hamdioui, M. Taouil, F. Smailbegovic (2024), Secure integrated circuit architecture.

Lichao Wu, Yoo-Seung Won, Dirmanto Jap, Guilherme Perin, Shivam Bhasin, Stjepan Picek (2023), Ablation Analysis for Multi-device Deep Learning-based Physical Side-channel Analysis, In IEEE Transactions on Dependable and Secure Computing p.1-12.

Sumit Diware, Abhairaj Singh, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi (2023), Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks, In IEEE Transactions on Emerging Topics in Computational Intelligence Volume 7 p.164 - 177.

Arthur Mercier, Nikita Smolin, Oliver Sihlovec, Stefanos Koffas, Stjepan Picek (2023), Backdoor Pony: Evaluating backdoor attacks and defenses in different domains, In SoftwareX Volume 22.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Leticia Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui (2023), Characterization and Test of Intermittent Over RESET in RRAMs, In Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS), IEEE.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Hassen Aziza (2023), Device-Aware Test for Ion Depletion Defects in RRAMs, Cristina Ceballos (Eds.), In Proceedings of the 2023 IEEE International Test Conference (ITC) p.246-255, IEEE.