D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2017), Mitigation of sense amplifier degradation using input switching, Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 858-863, IEEE.

I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor (2016), Comparative BTI Analysis for Various Sense Amplifier Designs, Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016, pp. 1-6, IEEE.

I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, W Dehaene (2016), Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability, In Baris Taskin, Prasun Ghosal (Eds.), Proceedings - IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2016), pp. 725-730, IEEE.

I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, W Dehaene (2016), Read Path Degradation Analysis in SRAM, Proceedings - 21st IEEE European Test Symposium, ETS 2016, pp. 1-2, IEEE.

I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2015), BTI analysis of SRAM write driver, In F Kurdahi, S Mir, MO Yu (Eds.), Proceedings of the 10th International Design and Test Symposium, IDT 2015, pp. 100-105, IEEE Society.

I.O. Agbo, M. Taouil, S. Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2015), Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier, In V Casola (Eds.), Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015, pp. 1-6, IEEE Society.

I.O. Agbo, M. Taouil, S. Hamdioui, H Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2015), Integral impact of BTI and voltage temperature variation on SRAM sense amplifier, In C Thibeault, L Anghel (Eds.), Proceedings - 33rd IEEE VLSI Test Symposium, pp. 1-6, IEEE Society.

M.S.K. Seyab, I.O. Agbo, S. Hamdioui, H Kukner, B Kaczer, Praveen Raghavan, Francky Catthoor (2014), Bias temperature instability analysis of FinFET based SRAM cells, In W Nebel, G Fettweis (Eds.), Proceedings of the 2014 International Conference on Design, Automation & Test in Europe, pp. 1-6, EDAA.