D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Hardware-based aging mitigation scheme for memory address decoder, 2019 IEEE European Test Symposium (ETS), pp. 1-6, IEEE.

D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 162-167, IEEE.

D.H.P. Kraak, M. Taouil, I.O. Agbo, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems, volume 27, pp. 1308-1321.

I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability, volume 99, pp. 52-61.

D.H.P. Kraak, C.C. Gürsoy, I.O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, 2019 IEEE Latin American Test Symposium (LATS), pp. 1-6, IEEE.

D.H.P. Kraak, I.O. Agbo, M. Taouil, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2018), Degradation analysis of high performance 14nm FinFET SRAM, 2018 Design, Automation Test in Europe Conference Exhibition (DATE), pp. 201-206.

I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018), Impact and mitigation of SRAM read path aging, In Microelectronics Reliability, volume 87, pp. 158-167.

I.O. Agbo (2018), Reliability Modeling and Mitigation for Embedded Memories, PhD Thesis, Delft University of Technology.

D.H.P. Kraak, M. Taouil, I.O. Agbo, S. Hamdioui, Pieter Weckx, Francky Catthoor, Stefan Cosemans (2017), Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems, volume 25, pp. 3464-3472.

I.O. Agbo, M. Taouil, D.H.P. Kraak, S. Hamdioui, Halil Kükner, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2017), Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems, volume 25, pp. 1444-1454.