2019

Daniël Kraak, Mottaqiallah Taouil, Innocent Okwudili Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019). Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 1308-1321.

Daniël Kraak, Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2019). Methodology for Application-Dependent Degradation Analysis of Memory Timing. In 2019 Design, Automation Test in Europe Conference Exhibition (DATE), 162-167, IEEE.

Innocent Okwudili Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019). Sense amplifier offset voltage analysis for both time-zero and time-dependent variability. Microelectronics Reliability 99 52-61.

Daniël Kraak, Cem Gürsoy, Innocent Okwudili Agbo, Mottaqiallah Taouil, M. Jenihhin, J. Raik, Said Hamdioui (2019). Software-Based Mitigation for Memory Address Decoder Aging. In 2019 IEEE Latin American Test Symposium (LATS), 1-6, IEEE.

2018

Daniël Kraak, Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2018). Degradation analysis of high performance 14nm FinFET SRAM. In 2018 Design, Automation Test in Europe Conference Exhibition (DATE), 201-206.

Innocent Okwudili Agbo (2018). Reliability Modeling and Mitigation for Embedded Memories. PhD Thesis, Delft University of Technology.

Innocent Okwudili Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018). Impact and mitigation of SRAM read path aging. Microelectronics Reliability 87 158-167.

2017

Innocent Okwudili Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, H. Kükner, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2017). Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 1444-1454.

Daniël Kraak, Mottaqiallah Taouil, Innocent Okwudili Agbo, Said Hamdioui, Pieter Weckx, Francky Catthoor, Stefan Cosemans (2017). Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 3464-3472.

Daniël Kraak, Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2017). Mitigation of sense amplifier degradation using input switching. In Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE), 858-863, IEEE.