2018

Daniël Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2018). Degradation analysis of high performance 14nm FinFET SRAM. In 2018 Design, Automation Test in Europe Conference Exhibition (DATE), 201-206.

Innocent Agbo (2018). Reliability Modeling and Mitigation for Embedded Memories. PhD Thesis, Delft University of Technology.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018). Impact and mitigation of SRAM read path aging. Microelectronics Reliability 87 158-167.

2017

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, H. Kükner, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2017). Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 1444-1454.

Daniël Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Francky Catthoor, Stefan Cosemans (2017). Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 3464-3472.

Daniël Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2017). Mitigation of sense amplifier degradation using input switching. In Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE), 858-863, IEEE.

2016

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2016). Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. In Baris Taskin and Prasun Ghosal (Eds.) Proceedings - IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2016), 725-730, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor (2016). Comparative BTI Analysis for Various Sense Amplifier Designs. In Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016, 1-6, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Franky Catthoor, Wim Dehaene (2016). Read Path Degradation Analysis in SRAM. In Proceedings - 21st IEEE European Test Symposium, ETS 2016, 1-2, IEEE.

2015

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, H Kukner, P Weckx, P Raghavan, F Catthoor (2015). Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. In C Thibeault and L Anghel (Eds.) Proceedings - 33rd IEEE VLSI Test Symposium, 1-6, IEEE Society.