H.A. Du Nguyen, J. Yu, M.F.M. Abu Lebdeh, M. Taouil, S. Hamdioui (2019), A Computation-In-Memory Accelerator Based on Resistive Devices, Proceedings of the International Symposium on Memory Systems, pp. 19-32, Association for Computing Machinery (ACM).

S. Hamdioui, H.A. Du Nguyen, M. Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando G. Redondo, G. Karunaratne, Abbas Rahimi, Luca Benini (2019), Applications of Computation-In-Memory Architectures based on Memristive Devices, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019, pp. 486-491, IEEE.

G.S. Rodrigues, J. S. Fonseca, F. L. Kastensmidt, V. Pouget, Alberto Bosio, S. Hamdioui (2019), Approximate TMR based on successive approximation and loop perforation in microprocessors, In Microelectronics Reliability, volume 100-101.

Ali Banagozar, Sander Stuijk, Henk Corporaal, J.S.S.M. Wong, M.F.M. Abu Lebdeh, J. Yu, S. Hamdioui (2019), CIM-SIM, In Sander Stuijk (Eds.), SCOPES'19, pp. 1-4, Association for Computing Machinery (ACM).

E.I. Vatajelu, Paolo Prinetto, M. Taouil, S. Hamdioui (2019), Challenges and Solutions in Emerging Memory Testing, In IEEE Transactions on Emerging Topics in Computing, volume 7, pp. 493-506.

Hassen Aziza, Christian Dufaza, Annie Perez, S. Hamdioui (2019), Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs, In Journal of Circuits, Systems and Computers, pp. 1-14.

G. Cardoso Medeiros, M. Taouil, M.C.R. Fieback, L. M. Bolzani Poehls, S. Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, Proceedings - 2019 IEEE European Test Symposium, ETS 2019, volume 2019-May, pp. 1-2, IEEE.

L. Wu, Siddharth Rao, M. Taouil, G. Cardoso Medeiros, M.C.R. Fieback, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing.

F. Augusto da Silva, Ahmet Cagri Bagbaba, S. Hamdioui, Christian Sauer (2019), Efficient Methodology for ISO26262 Functional Safety Verification, In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, pp. 255-256, IEEE.

Sohaib Majzoub, Resve A. Saleh, I. Ashraf, M. Taouil, S. Hamdioui (2019), Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era, In IEEE Access, volume 7, pp. 33115-33129.