2019

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019). A Computation-In-Memory Accelerator Based on Resistive Devices. In Proceedings of the International Symposium on Memory Systems, 1-14.

Daniël Kraak, Mottaqiallah Taouil, Innocent Okwudili Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019). Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 1308-1321.

Ali Banagozar, Kanishkan Vadivel, Sander Stuijk, Henk Corporaal, Stephan Wong, Muath Abu Lebdeh, Jintao Yu, Said Hamdioui (2019). CIM-SIM. In Sander Stuijk (Eds.) SCOPES'19, 1-4, Association for Computing Machinery (ACM).

Muath Abu Lebdeh, Uljana Reinsalu, Hoang Anh Du Nguyen, Stephan Wong, Said Hamdioui (2019). Memristive Device Based Circuits for Computation-in-Memory Architectures. In 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, IEEE.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui (2019). System-level sub-20 nm planar and FinFET CMOS delay modelling for supply and threshold voltage scaling under process variation. Journal of Low Power Electronics 15 1-10.

E.I. Vatajelu, Paolo Prinetto, Mottaqiallah Taouil, Said Hamdioui (2019). Challenges and Solutions in Emerging Memory Testing. IEEE Transactions on Emerging Topics in Computing 7 493-506.

Daniël Kraak, Cem Gürsoy, Innocent Okwudili Agbo, Mottaqiallah Taouil, M. Jenihhin, J. Raik, Said Hamdioui (2019). Software-Based Mitigation for Memory Address Decoder Aging. In 2019 IEEE Latin American Test Symposium (LATS), 1-6, IEEE.

Daniël Kraak, Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019). Hardware-based aging mitigation scheme for memory address decoder. In 2019 IEEE European Test Symposium (ETS), 1-6, IEEE.

Innocent Okwudili Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019). Sense amplifier offset voltage analysis for both time-zero and time-dependent variability. Microelectronics Reliability 99 52-61.

Daniël Kraak, Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019). Methodology for Application-Dependent Degradation Analysis of Memory Timing. In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 162-167, IEEE.