Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems volume 27 pp. 1308-1321.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Hardware-based aging mitigation scheme for memory address decoder, 2019 IEEE European Test Symposium (ETS) pp. 1-6 IEEE.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) pp. 162-167 IEEE.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability volume 99 pp. 52-61.

Daniël Kraak, C. C. Gursoy, I. O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, 2019 IEEE Latin American Test Symposium (LATS) pp. 1-6 IEEE.

D. Kraak, M. Taouil, S. Hamdioui, P. Weckx, F. Catthoor, A. Chatterjee, A. Singh, H. Wunderlich, N. Karimi (2018), Device aging: A reliability and security concern, 2018 IEEE 23rd European Test Symposium (ETS) pp. 1-10.

D. Kraak, I. Agbo, M. Taouil, S. Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2018), Degradation analysis of high performance 14nm FinFET SRAM, 2018 Design, Automation Test in Europe Conference Exhibition (DATE) pp. 201-206.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018), Impact and mitigation of SRAM read path aging, In Microelectronics Reliability volume 87 pp. 158-167.

Daniël Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Francky Catthoor, Stefan Cosemans (2017), Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems volume 25 pp. 3464-3472.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, H. Kükner, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2017), Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems volume 25 pp. 1444-1454.