2018

Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, P. Weckx, F. Catthoor, A. Chatterjee, A. Singh, H. Wunderlich, N. Karimi (2018). Device aging: A reliability and security concern. In 2018 IEEE 23rd European Test Symposium (ETS), 1-10.

Daniël Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2018). Degradation analysis of high performance 14nm FinFET SRAM. In 2018 Design, Automation Test in Europe Conference Exhibition (DATE), 201-206.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018). Impact and mitigation of SRAM read path aging. Microelectronics Reliability 87 158-167.

2017

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, H. Kükner, Pieter Weckx, Praveen Raghavan, Francky Catthoor (2017). Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 1444-1454.

Daniël Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2017). Mitigation of sense amplifier degradation using input switching. In Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE), 858-863, IEEE.

Daniël Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Francky Catthoor, Stefan Cosemans (2017). Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 3464-3472.