2018

Guilherme Cardoso Medeiros, L.M. Bolzani Poehls, Mottaqiallah Taouil, F. Luis Vargas, Said Hamdioui (2018). A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectronics Reliability 88-90 355-359.