Z Al-Ars, S Hamdioui (2007), Automatic analyses of memory faulty behaviour in defective memories, Orailoglu, A. Hamdiuoi, S. (Eds.), In Design & Technology of Integrated Systems 2007 p.41-46, IEEE Society.

S Kootkar, Z Al-Ars (2007), Design and implementation of reliable wireless sensor networks-a case study in commuter trains, s.n. (Eds.), In Annual Workshop on Circuits, Systems and Signal Processing p.303-306, STW.

L Hasan, Z Al-Ars, S Vassiliadis (2007), Hardware acceleration of sequence alignment algorithms: an overview, Orailoglu, A. Hamdiuoi, S. (Eds.), In Design & Technology of Integrated Systems 2007 p.96-101, IEEE Society.

Z Al-Ars, S Hamdioui, GN Gaydadjiev (2007), Manifestation of precharge faults in high speed DRAM devices, Krasniewski, E. Gramatova, E. Girard, P., Garbolina, T. (Eds.), In 2007 IEEE workshop on Design and diagnostics of electronic circuits and systems p.179-184, IEEE Society.

Z Al-Ars, S Hamdioui, GN Gaydadjiev (2007), Optimizing test length for soft faults in DRAM devices, s.n. (Eds.), In 25th IEEE VLSI Test Symposium p.59-66, IEEE Society.

S Hamdioui, Z Al-Ars, J Jimenez, J Calero (2007), PPM recuction on embedded memories in system on chip, Lisa O'Conner (Eds.), In 12th IEEE European Test Symposium p.85-90, IEEE Society.

L Hasan, Z Al-Ars (2007), Performance improvement of the Smith-Waterman algorithm, s.n. (Eds.), In Annual Workshop on Circuits, Systems and Signal Processing p.211-214, STW.

S Hamdioui, Z Al-Ars, GN Gaydadjiev, J delos Reyes (2006), Comparison of static and dynamic faults in 65nm memory technology, s.n. (Eds.), In International Design and Test workshop p.-, IEEE Society.

Z Al-Ars, S Hamdioui, AJ van de Goor, GN Gaydadjiev, J Vollrath (2006), DRAM-specific space of memory tests, s.n. (Eds.), In International Test Conference 2006 p.1-10, IEEE Society.

EB Tuncer, Z Al-Ars, E Akar, J Beintema, IS Sariyildiz (2006), Designmap: capturing design knowledge in architectural practice, The Joint International Conference on Construction Culture, Innovation and Management (CCIM) p.90-91.