CR Lageweg, SD Cotofana, S Vassiliadis (2004), Binary addition based on single electron tunneling devices, In IEEE-NANO 2004 Proceedings p.1-4, IEEE Society.

CR Lageweg, SD Cotofana, S Vassiliadis (2004), Binary multiplication based on Single Electron Tunneling, B Werner (Eds.), In 15th IEEE International conference on application-specific systems, architectures, and processors - ASAP 2004 p.152-166, IEEE.

AM Molnos, MJM Heijligers, SD Cotofana, JTJ van Eijndhoven (2004), Cache partitioning options for compositional multimedia applications, In Proceedings of Pro-RISC 2004 p.86-90, Technology Foundation STW.

K Bertels, N Panchanathan, S Vassiliadis, BP Ebrahimi (2004), Centralized matchmaking for minimal agents, T Gonzalez (Eds.), In Proceedings of the 16th IASTED International conference Parallel and Distributed Computing and Systems p.608-613, ACTA Press.

C Hu, SD Cotofana, J Jiang (2004), Compact current and current noise models for single-electron tunneling transistors, In IEEE-NANO 2004 Proceedings p.1-4, IEEE Society.

AM Molnos, MJM Heijligers, SD Cotofana, JTJ van Eijndhoven (2004), Compositional memory systems for data intensive applications, G Gielen, J Figueras (Eds.), In Design, automation and test in Europe; Date04 Proceedings p.1-2, IEEE Society.

W Caarls, PP Jonker, H Corporaal (2004), Data- and Task Parallel Image Processing on a Mixed SIMD-ILP Platform using Skeletons and Asynchronous RPC, M. Schweizer (Eds.), In Proc. 5th PROGRESS Symposium on Embedded Systems p.27-34, STW.

P Celinski, D Abbott, SD Cotofana (2004), Delay evaluation of high speed data-path circuits based on threshold logic, E Macii, V Paliouras, O Koufopavlou (Eds.), In Integrated circuit and system design; Power and timing modeling, optimization and simulation p.899-906, Springer.

Y Wu, JSSM Wong (2004), Design challenges in security processing, In Proceedings of Pro-RISC 2004 p.189-194, Technology Foundation STW.

AJ van de Goor, S Hamdioui, R Wadsworth (2004), Detecting faults in peripheral circuits and an evaluation of SRAM tests, In Proceedings International Test Conference 2004 p.114-123, International Test Conference.