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Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui (2020), A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.792-797, Institute of Electrical and Electronics Engineers (IEEE).

Dennis D. Weller, Ahmet Turan Erozan, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori (2020), A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 28 p.1496-1504.

Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2020), A Security Verification Template to Assess Cache Architecture Vulnerabilities, In 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.1-6, IEEE.

Alina L. Machidon, Octavian M. Machidon, Cătălin B. Ciobanu, Petre L. Ogrutan (2020), Accelerating a geometrical approximated PCA algorithm using AVX2 and CUDA, In Remote Sensing Volume 12 p.1-29.

Jian Fang, Jianyu Chen, Jinho Lee, Zaid Al-Ars, Peter Hofstee (2020), An Efficient High-Throughput LZ77-Based Decompressor in Reconfigurable Logic, In Journal of Signal Processing Systems p.1-17.

Tanveer Ahmad, Nauman Ahmed, Johan Peltenburg, Zaid Al-Ars (2020), ArrowSAM: In-Memory Genomics Data Processing Using Apache Arrow, In 2020 3rd International Conference on Computer Applications & Information Security (ICCAIS) p.1-6, IEEE.

Tom Mokveld, Jasper Linthorst, Zaid Al-Ars, Henne Holstege, Marcel Reinders (2020), CHOP: Haplotype-aware path indexing in population graphs, In Genome biology Volume 21 p.1-16.

L. Wu, Siddharth Rao, M. Taouil, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2020), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2020), Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification, R.S. Bilof (Eds.), In Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019 Volume 2019-December p.129-134, IEEE.