Rob A. Damsteegt, Ramon W.J. Overwater, Masoud Babaie, Fabio Sebastiano (2023), A Benchmark of Cryo-CMOS 40-nm Embedded SRAM/DRAMs for Quantum Computing, In ESSCIRC 2023 - IEEE 49th European Solid State Circuits Conference p.165-168, IEEE.

Niels Fakkel, Mohsen Mortazavi, Ramon Overwater, Fabio Sebastiano, Masoud Babaie (2023), A Cryo-CMOS DAC-based 40 Gb/s PAM4 Wireline Transmitter for Quantum Computing Applications, Jennifer Kitchen, Steven Turner (Eds.), In 2023 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2023 p.257-260, IEEE.

Jiang Gong, Edoardo Charbon, Fabio Sebastiano, Masoud Babaie (2023), A Cryo-CMOS PLL for Quantum Computing Applications, In IEEE Journal of Solid-State Circuits Volume 58 p.1362-1375.

Gerd Kiene, Ramon W.J. Overwater, Masoud Babaie, Fabio Sebastiano (2023), A Cryo-CMOS SAR ADC With FIA Sampling Driver Enabled by Cryogenic-Aware Back-Biasing, In IEEE Transactions on Circuits and Systems I: Regular Papers Volume 71 p.1071-1081.

M. Babaie, L.A. Enthoven, F. Sebastiano (2023), Bias voltage generator.

Jens Anders, Masoud babaie, Imran Bashir, Edoardo Charbon, Lotte Geck, Mohamed I. Ibrahim, Fabio Sebastiano, Robert Bogdan Staszewski, Andrei Vladimirescu, More Authors (2023), CMOS integrated circuits for the quantum information sciences, In IEEE Transactions on Quantum Engineering Volume 4 p.1-30.

Ramon W.J. Overwater, Masoud Babaie, Fabio Sebastiano (2023), Cryogenic-Aware Forward Body Biasing in Bulk CMOS, In IEEE Electron Device Letters Volume 45 p.152-155.

Ehsan Shokrolahzade, Fabio Sebastiano, Faisal Mubarak, Masoud Babaie, Marco Spirito (2023), Impedance Standard Substrate Characterization and em model definition for Cryogenic and Quantum-Computing Applications, In 2023 IEEE/MTT-S International Microwave Symposium, IMS 2023 p.557-560, IEEE.

F. Sebastiano (2023), Low power voltage controllable oscillator with rail-to-rail output.

Xiao Xue, Pascal t. Hart, Edoardo Charbon, Fabio Sebastiano, Andrei Vladimirescu (2023), Nano-MOSFET - Foundation of Quantum Computing Part I, In IEEE Nanotechnology Magazine Volume 17 p.31-40.