G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE .

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen (2021), Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 37 p.383-394.

G. Cardoso Medeiros, M. Fieback, L. Wu, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui (2021), Hard-to-Detect Fault Analysis in FinFET SRAMs, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1271-1284.

G. Cardoso Medeiros, M. Fieback, Thiago Copetti, A.B. Gebregiorgis, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui (2021), Improving the Detection of Undefined State Faults in FinFET SRAMs, In International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS), IEEE .

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2021), Intermittent Undefined State Fault in RRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE .

Aneesh Balakrishnan, G. Cardoso Medeiros, Cemil Cem Gursoy, S. Hamdioui, Maksim Jenihhin, Dan Alexandrescu (2021), Modeling Soft-Error Reliability Under Variability, In 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.1-6, IEEE .

Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui (2020), A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.792-797, Institute of Electrical and Electronics Engineers (IEEE).

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen (2020), Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects, In 21st IEEE Latin-American Test Symposium, LATS 2020, Institute of Electrical and Electronics Engineers (IEEE).

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE .

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.