Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2022), Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs, In IEEE Transactions on Computers.

Troya Köylü, Luiza Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil (2022), Exploiting PUF Variation to Detect Fault Injection Attacks, Hana Kubátová, Andreas Steininger, Maksim Jenihhin, Tomasz Garbolino, Petr Fišer, Jan Bělohoubek, Jaroslav Borecký (Eds.), In Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.74-79, IEEE .

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2022), MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design, In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2021), APmap: An Open-Source Compiler for Automata Processors, In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 41 p.196-200.

Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Applying Thermal Side-Channel Attacks on Asymmetric Cryptography, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1930 - 1942.

L. Wu, Siddharth Rao, M. Taouil, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2021), Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM, In Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021 p.1717-1722, IEEE .

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2021), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs, In 2020 IEEE International Test Conference, ITC 2020 p.1-10, IEEE .

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE .

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE .

T.C. Köylü, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2021), Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks, In 2021 18th International Conference on Privacy, Security and Trust (PST) p.1-10, IEEE .