S. Hamdioui, M. Taouil (2024), Device Aware Test for Memory Units.

F. Smailbegovic, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2024), Integrated circuit device for iot applications.

S. Hamdioui, M. Taouil, F. Smailbegovic (2024), Secure integrated circuit architecture.

Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2023), A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks, Smail Niar, Hamza Ouarnoughi, Amund Skavhaug (Eds.), In Proceedings of the 2023 26th Euromicro Conference on Digital System Design (DSD) p.87-94, IEEE.

T.C. Köylü, Cezar Reinbrecht, A.B. Gebregiorgis, S. Hamdioui, M. Taouil (2023), A Survey on Machine Learning in Hardware Security, In ACM Journal on Emerging Technologies in Computing Systems Volume 19.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Leticia Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui (2023), Characterization and Test of Intermittent Over RESET in RRAMs, In Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS), IEEE.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui (2023), Device Aware Diagnosis for Unique Defects in STT-MRAMs, In Proceedings of the 2023 IEEE 32nd Asian Test Symposium, ATS 2023, IEEE.

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui (2023), Device-Aware Test for Back-Hopping Defects in STT-MRAMs, In 2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings, Institute of Electrical and Electronics Engineers (IEEE).