H. Aziza, M. Fieback, S. Hamdioui, H. Xun, M. Taouil (2025), Conductance variability in RRAM and its implications at the neural network level, In Microelectronics Reliability Volume 166.

Abhiroop Bhowmik, Subin Babukutty, Mottaqiallah Taouil, Moritz Fieback (2024), A Unified Functional Safety EDA Framework for Accurate Diagnostic Coverage Estimation, In 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration, VLSI-SoC 2024, IEEE.

H. Aziza, J. Postel-Pellerin, M. Fieback, S. Hamdioui, H. Xun, M. Taouil, K. Coulie, W. Rahajandraibe (2024), Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing, In 2024 IEEE 25th Latin American Test Symposium (LATS), IEEE.

T. S. Copetti, A. Chordia, M. Fieback, M. Taouil, S. Hamdioui, L. M. Bolzani Poehls (2024), Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs, In 2024 IEEE 25th Latin American Test Symposium, LATS 2024, IEEE.

Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil (2024), Counteracting Rowhammer by Data Alternation, In Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024, IEEE.

Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui (2024), Defects, Fault Modeling, and Test Development Framework for FeFETs, In Proceedings - 2024 IEEE International Test Conference, ITC 2024 p.91-95, IEEE.

Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui (2024), Design-for-Test for Intermittent Faults in STT-MRAMs, In 2024 IEEE European Test Symposium (ETS).

S. Hamdioui, M. Taouil (2024), Device Aware Test for Memory Units.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2024), Device-Aware Diagnosis for Yield Learning in RRAMs, In 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings, IEEE.

F. Smailbegovic, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2024), Integrated circuit device for iot applications.