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T.C. Köylü, Cezar Reinbrecht, A.B. Gebregiorgis, S. Hamdioui, M. Taouil (2023), A Survey on Machine Learning in Hardware Security, In ACM Journal on Emerging Technologies in Computing Systems Volume 19.

T.O. Mokveld, Z. Al-Ars, Erik A. Sistermans, M.J.T. Reinders (2023), A comprehensive performance analysis of sequence-based within-sample testing NIPT methods, In PLoS ONE Volume 18.

Nima Esmi, Yasaman Golshan, Sara Asadi, Asadollah Shahbahrami, Georgi Gaydadjiev (2023), A fuzzy fine-tuned model for COVID-19 diagnosis, In Computers in Biology and Medicine Volume 153.

Alex Hirvonen, Topi Leppänen, Kari Hepola, Joonas Multanen, Joost Hoozemans, Pekka Jääskeläinen (2023), AEx: Automated High-Level Synthesis of Compiler Programmable Co-Processors, In Journal of Signal Processing Systems.

Sumit Diware, Abhairaj Singh, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi (2023), Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks, In IEEE Transactions on Emerging Topics in Computational Intelligence Volume 7 p.164 - 177.

Xiaotao Jia, Huiyi Gu, Yuhao Liu, Jianlei Yang, Xueyan Wang, Weitao Pan, Youguang Zhang, Sorin Cotofana, Weisheng Zhao (2023), An Energy-Efficient Bayesian Neural Network Implementation Using Stochastic Computing Method, In IEEE Transactions on Neural Networks and Learning Systems p.1-11.

Matthijs A. Reukers, Yongding Tian, Zaid Al-Ars, Peter Hofstee, Matthijs Brobbel, Johan Peltenburg, Jeroen van Straten (2023), An Intermediate Representation for Composable Typed Streaming Dataflow Designs, In CEUR Workshop Proceedings.

Muhammad Umair Khan, Yawar Abbas, Heba Abunahla, Moh'd Rezeq, Anas Alazzam, Nahla Alamoodi, Baker Mohammad (2023), Biocompatible humidity sensor using paper cellulose fiber/GO matrix for human health and environment monitoring, In Sensors and Actuators B: Chemical Volume 393.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE .