Mahdi Zahedi, Muah Abu Lebdeh, Christopher Bengel, Dirk Wouters, Stephan Menzel, Manuel Le Gallo, Abu Sebastian, Stephan Wong, Said Hamdioui (2022), MNEMOSENE: Tile Architecture and Simulator for Memristor-based Computation-in-memory, In ACM Journal on Emerging Technologies in Computing Systems Volume 18.

Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Said Hamdioui, Sorin Cotofana (2022), Non-Binary Spin Wave Based Circuit Design, In IEEE Transactions on Circuits and Systems I: Regular Papers Volume 69 p.3888-3900.

Cemil Cem Gursoy, Daniël Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui (2022), On BTI Aging Rejuvenation in Memory Address Decoders, In Proceedings of the 2022 IEEE 23rd Latin American Test Symposium (LATS) p.1-6, IEEE.

N. Khammassi, I. Ashraf, J. V. Someren, R. Nane, A. M. Krol, M. A. Rol, L. Lao, K. Bertels, C. G. Almudever (2022), OpenQL: A Portable Quantum Programming Framework for Quantum Accelerators, In ACM Journal on Emerging Technologies in Computing Systems Volume 18.

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi Tahoori (2022), PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui (2022), RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs), In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama (2022), Rapid Design-Space Exploration for Low-Power Manycores under Process Variation utilizing Machine Learning, In IEEE Access Volume 10 p.70187-70203.

P. Bernardi, R. Cantoro, A. Coyette, W. Dobbeleare, M. Fieback, A. Floridia, G. Gielenk, A. M. Guerriero, S. Hamdioui, More Authors (2022), Recent Trends and Perspectives on Defect-Oriented Testing, Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos (Eds.), In Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, IEEE.

Abhairaj Singh, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui (2022), Referencing-in-Array Scheme for RRAM-based CIM Architecture, Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu (Eds.), In Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 p.1413-1418, IEEE.

Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil (2022), Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes, In Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1189-1192, IEEE.