Jason I. Brown, Theodore Kolokolnikov, Robert E. Kooij (2024), New approximations for network reliability, In Networks Volume 84 p.51-63.

Giovanni Finocchio, Jean Anne C. Incorvia, Joseph S. Friedman, Qu Yang, Anna Giordano, Julie Grollier, Hyunsoo Yang, Sorin D. Cotofana, Peng Lin, More Authors (2024), Roadmap for unconventional computing with nanotechnology, In Nano Futures.

S. Hamdioui, M. Taouil, F. Smailbegovic (2024), Secure integrated circuit architecture.

Abhairaj Singh, Rajendra Bishnoi, Ali Kaichouhi, Sumit Diware, Rajiv V. Joshi, Said Hamdioui (2023), A 115.1 TOPS/W, 12.1 TOPS/mm²Computation-in-Memory using Ring-Oscillator based ADC for Edge AI, In AICAS 2023 - IEEE International Conference on Artificial Intelligence Circuits and Systems, Proceeding, IEEE.

T.C. Köylü, Cezar Reinbrecht, A.B. Gebregiorgis, S. Hamdioui, M. Taouil (2023), A Survey on Machine Learning in Hardware Security, In ACM Journal on Emerging Technologies in Computing Systems Volume 19.

Sumit Diware, Abhairaj Singh, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi (2023), Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks, In IEEE Transactions on Emerging Topics in Computational Intelligence Volume 7 p.164 - 177.

Ran Xu, Fenghua Wang, Robert E. Kooij (2023), Controller Placement with Respect to Controller Reachability, In Proceedings of the 2023 7th International Conference on System Reliability and Safety (ICSRS) p.312-321, IEEE.

T.C. Köylü (2023), Countermeasures against Fault Injection Attacks in Neural Networks and Processors, PhD Thesis Delft University of Technology.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.